- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensions; measuring angles; measuring areas; measuring irregularities of surfaces or contours
- G01B 11/28 - Measuring arrangements characterised by the use of optical techniques for measuring areas
Patent holdings for IPC class G01B 11/28
Total number of patents in this class: 302
10-year publication summary
|
33
|
28
|
26
|
23
|
18
|
18
|
17
|
16
|
13
|
4
|
| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Applied Materials, Inc. | 16587 |
9 |
| KLA-Tencor Corporation | 2574 |
9 |
| NEC Corporation | 32703 |
7 |
| Pictometry International Corp. | 203 |
7 |
| Siemens Industry, Inc. | 1417 |
6 |
| Mitutoyo Corporation | 1218 |
5 |
| Onto Innovation Inc. | 340 |
5 |
| Samsung Electronics Co., Ltd. | 131630 |
4 |
| Pratt & Whitney Canada Corp. | 4215 |
4 |
| General Electric Company | 18133 |
3 |
| Halliburton Energy Services, Inc. | 20165 |
3 |
| Kateeva, Inc. | 376 |
3 |
| KLA-Tencor Technologies Corporation | 346 |
3 |
| Leavitt Medical, Inc. | 36 |
3 |
| Continental Autonomous Mobility US, LLC | 246 |
3 |
| Xerox Corporation | 7503 |
2 |
| Centre National de La Recherche Scientifique | 9632 |
2 |
| Toshiba Corporation | 12017 |
2 |
| Panasonic Corporation | 20786 |
2 |
| Texas Instruments Incorporated | 19376 |
2 |
| Other owners | 218 |